Defects in SiC - sponsored by DOE, in collaboration with NREL

Sami A. El Hageali, Harvey Guthrey, Steven Johnston, Jake Soto, Bruce Odekirk, Brian P. Gorman, and Mowafak Al-Jassim , "Nondestructive microstructural investigation of defects in 4H-SiC epilayers using a multiscale luminescence analysis approach", Journal of Applied Physics 131, 185705 (2022)